Encyclopedia of Materials Characterization – Surfaces, Interfaces, Thin Films
ISBN/ASIN: 9780080523606,9780750691680 | 1992 | English | pdf | 800/500 pages | 20.3 Mb
Publisher: Elsevier | Author: Brundle, C.Richard; Evans, Charles A. Jr.; Wilson, Shaun(eds.)
This is a comprehensive volume on analytical techniques used in materials science for the characterization of surfaces, interfaces and thin films. This flagship volume is a unique, stand-alone reference for materials science practitioners, process engineers, students and anyone with a need to know about the capabilities available in materials analysis. An encyclopedia of 50 concise articles, this book will also be a practical companion to the forthcoming books in the series.