In-Circuit Testing Cover

In-Circuit Testing

ISBN/ASIN: 9789401170116,9789401170093 | 1985 | English | pdf | 244/254 pages | 4.77 Mb
Publisher: Springer Netherlands | Author: John Bateson (auth.) | Edition: 1

The aim of this text is to increase your understanding of the methods employed for improving the quality of printed circuit boards (PCBs) in a practical manufacturing environment, by discussing printed circuit board faults and the test strategies implemented to detect these faults. This text emphasizes in-circuit testing as a prime test and diagnostic technique. Test strategies are described – implementing functional board testers, in-circuit board testers, in-circuit analyzers, and loaded­ board shorts testers. Also discussed are in-circuit tester's hardware, software, fix turing, and programming. Specific attention has been given to the in-circuit tester's capabilities and limitations, features and benefits, advantages and disadvantages. Chapter 5, as part of the total production testing process, discusses rework stations, network­ ing, and test area management. Chapter 8 is devoted to discussing the benefits derived by employing in-circuit testing in the service repair arena. This text concludes with chapters on vendor investiga­ tion and a financial justification. Additional emphasis is placed on having design engineering acquire an interest in manufacturability, testability, and the importance of consulting with manufacturing early in the design process. This book is designed for ease of reading and comprehension for all levels of interest: ATE students, fust-time ATE users, as well as those involved in test, manufacturing, quality control or assurance, production, engineering, and management.

In-Circuit Testing

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