System-on-Chip Test Architectures. Nanometer Design for Testability Cover

System-on-Chip Test Architectures. Nanometer Design for Testability

ISBN/ASIN: 9780123739735 | 2008 | English | pdf | 862/862 pages | 21.8 Mb
Publisher: Morgan Kaufmann | Author: Laung-Terng Wang, Charles E. Stroud and Nur A. Touba (Eds.)

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