Quantitative Data Processing in Scanning Probe Microscopy. SPM Applications for Nanometrology Cover

Quantitative Data Processing in Scanning Probe Microscopy. SPM Applications for Nanometrology

ISBN/ASIN: 9781455730582 | 2012 | English | pdf | 316/316 pages | 7.95 Mb
Publisher: William Andrew | Author: Petr Klapetek (Auth.)

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